Texas Instruments TPS7H60x5EVM Evaluation Modules
Texas Instruments TPS7H60x5EVM Evaluation Modules are designed to quickly and easily demonstrate the TPS7H60x5-SEP gate drivers. By default, the TPS7H60x5EVM modules operate with the PWM mode of TPS7H60x5-SP, which obtains an input of one switching signal and internally generates a complementary signal. Users can change the default to the IIM mode, where the two outputs work independently with minimal changes. By inputting a 0V to 5V waveform on J9 or J6/J15, it can be connected to the inputs of the TPS7H60x5-SEP to run the driver.
The TI TPS7H60x5EVM evaluation modules provide a 25ns typical propagation delay in independent input mode with a 1.3A peak source and a 3A peak sink current. The devices offer split outputs for adjustable turn-on and turn-off times.
Features
- Selectable input interlock protection in independent input mode
- Split outputs for adjustable turn-on and turn-off times
- 25ns typical propagation delay in independent input mode
- 1.3A peak source, 3A peak sink current
Applications
- Communications payload
- Command and data handling
- Satellite electrical power system
- Space satellite point of load supply for FPGA core voltage rails
Associated EVMs
Texas Instruments TPS7H6023EVM-CVAL Driver Evaluation Module
Tests and evaluates the TPS7H6023-SP, a radiation-hardened 22V half-bridge GaN gate driver.
Texas Instruments TPS7H6013EVM-CVAL Gate Driver Evaluation Module
Evaluates the TPS7H6013-SP device, a radiation-hardened, QMLV 60V half-bridge GaN gate driver.
Texas Instruments TPS7H6003EVM-CVAL Evaluation Module
Accepts up to a 150V input to test the reliability of the TPS7H6003-SP by driving the EPC2307.
Board Overviews
Solder Layouts
Publicerad: 2024-09-12
| Uppdaterad: 2024-09-18